Practical Materials Characterization, 2014

Coordinator: Sardela Mauro

Language: English

Approximative price 108.44 €

In Print (Delivery period: 15 days).

Add to cartAdd to cart
Practical Materials Characterization
Publication date:
Support: Print on demand

105.49 €

Subject to availability at the publisher.

Add to cartAdd to cart
Practical Materials Characterization
237 p. · 15.5x23.5 cm · Hardback
Practical Materials Characterization covers the most common materials analysis techniques in a single volume. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences.

1. X-Ray Diffraction and Reflectivity.-2.Introduction to Optical Characterization of Materials.- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES).- 4. Secondary Ion Mass Spectrometry.- 5. Transmission Electron Microscopy.

Mauro Sardela (editor) is a Senior Research Scientist and Manager of the X-Ray Analysis Laboratory at the Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Dr. Sardela received his PhD in Material Science, in 1994, from the Institute of Physics of Materials, Linköping University, Sweden. He has authored and co-authored several publications in the area of x-ray scattering, materials analysis in general, with focus on semiconductors, complex oxides, nanomaterials, etc.

Judith E. Baker was a Senior Research Scientist at the Frederick Seitz Materials Research Laboratory, University of Illinois.  She began working with SIMS in the early 1970's and continued until she retired in 2003. Her collaborative efforts with researchers at the University of Illinois, other universities, and National Laboratories resulted in co-authorship of over 90 reviewed journal publications. Most of the publications include SIMS applications and involve a wide variety of materials.

Richard T. Haasch is a Senior Research Scientist and leader of the electron spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in analytical chemistry from the University of Minnesota in 1990. He has authored or co-authored over 90 publications and presentations in the area of surface analysis, materials characterization, and materials chemistry.

Julio A.N.T. Soares is a Senior Research Scientist and manager of the Laser and Spectroscopy facilities at the Frederick Seitz Materials Research Laboratory, University of Illinois. He received a Ph.D. in Solid State Physics from the University of Sao Paulo, Brazil, in 1997. He has authored or co-authored several publications and presentations in the area of opticalcharacterization of materials.

Jianguo Wen is a Materials Scientist at Electron Microscopy Center, Argonne National Laboratory. He received

Presents cross-comparison between materials characterization techniques Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem Focuses on applications and clear data interpretation without extensive mathematics Includes supplementary material: sn.pub/extras