Description
Design for Manufacturability, Softcover reprint of the original 1st ed. 2014
From 1D to 4D for 90–22 nm Technology Nodes
Author: Balasinski Artur
Language: EnglishSubjects for Design for Manufacturability:
Publication date: 08-2016
Support: Print on demand
Publication date: 10-2013
278 p. · 15.5x23.5 cm · Hardback
Description
/li>Contents
/li>Biography
/li>Comment
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Preface.- Classic DfM: from 2D to 3D.- DfM at 28 nm and Beyond.- New DfM Domain: Stress Effects.- Conclusions and Future Work.
Artur Balasinski is a Technology Design Integration Manager for Cypress Semiconductor in San Jose, California.
Provides design for manufacturability guidelines on layout techniques for the most advanced, 22 nm technology nodes
Includes information valuable to layout designers, packaging engineers and quality engineers, working on memories, logic, system-on-chip and system-in-package
Offers a highly-accessible, single-source reference to information otherwise available only from disparate sources
Helps readers to translate reliability methodology into real design flows