Description
VLSI Design and Test, 1st ed. 2017
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Communications in Computer and Information Science Series, Vol. 711
Coordinators: Kaushik Brajesh Kumar, Dasgupta Sudeb, Singh Virendra
Language: English
Subject for VLSI Design and Test:
Keywords
Analog/Mixed Signal; Architecture and CAD; Circuits; Design Verification; Devices and Technology – I; Devices and Technology – II; Digital circuits; Digital design; Embedded systems; Emerging Technologies and Memory; Low Power Design and Test; Multi-processor architectures; Network-on-chip; RF Circuits; SRAM arrays; System Design; Testing and verification; VLSI Architectures; VLSI design; VLSI Testing
Support: Print on demand
Description
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.
