Description
Soft Error Mechanisms, Modeling and Mitigation, Softcover reprint of the original 1st ed. 2016
Language: EnglishSubject for Soft Error Mechanisms, Modeling and Mitigation:
Publication date: 03-2016
Support: Print on demand
Publication date: 06-2018
Support: Print on demand
Description
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/li>Biography
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Introduction.- Mitigation of Single Event Effects.- Transmission Gate (TG) Based Soft Error Mitigation Methods.- Single Event Soft Error Mechanisms.- Modeling Single Event Crosstalk Noise in Nanometer Technologies.- Modeling of Single Event Coupling Delay and Speedup Effects.- Single Event Upset Hardening of Interconnects.- Soft-Error Aware Power Optimization.- Dynamic Threshold Technique for Soft Error and Soft Delay Mitigation.
Dr. Selahattin Sayil is an Associate Professor in the Philip M. Drayer Department of Electrical Engineering at Lamar University. His research focuses on Radiation effects modeling and hardening at the circuit level, Reliability analysis of low power designs, and Interconnect modeling and noise prediction.