Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers

Advances in Imaging and Electron Physics Series, Vol. 157

Director of collection: Hawkes Peter W.

Language: Anglais

236.94 €

In Print (Delivery period: 14 days).

Add to cartAdd to cart
Publication date:
373 p. · 15.2x22.9 cm · Hardback
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
1. Charged particles in electromagnetic fields

2. Language of aberration expansions in charged particle optics

3. Transporting charged particle beams in static fields

4. Transporting charged particles in radiofrequency fields

5. Static magnetic charged particle analyzers

6. Electrostatic energy analyzers

7. Mass analyzers with combined electrostatic and magnetic fields

8. Time-of-flight mass analyzers

9. Radiofrequency mass analyzers
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general