Advances in Imaging and Electron Physics


Language: Anglais

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Updated with contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
Complex-valued neural network and complex-valued BP, by T. Nitta
'Disorder', structured diffuse scattering and local crystal chemistry, by R.L. Withers
Nonlinear systems for image processing, by S. Morfu et al.
The Foldy-Wouthuysen transformation technique in optics, by S.A. Khan
Stack filters: from definition to design algorithms, by N. Hirata
Blind source separation: the sparsity revolution, by J-L. Sparck et al.