Description
Particle Characterization in Technology
Volume I: Application and Microanalysis
Coordinator: Beddow John Keith
Language: English
Subjects for Particle Characterization in Technology:
Keywords
Sample Preparation; Alvin Lieberman; Maximum Feret's Diameter; Brian H; Kaye; Particle Systems; David L; Davidson; Minimum Ignition Temperature; David L; O; Smith; Primary Ion Beam; John A; Hersey; Bulk Solids; John Gavrilovic; Moisture Content; John Keith Beddow; Fractal Dimension; K; N; Palmer; Sim Technique; Paul Wieser; Richardson Plot; R; F; Karuhn; Dust Explosion; R; H; Berg; Stress Path; Raimund Kaufmann; LAMMA; Robert A; Lohnes; Si Yield; Shepard Kinsman; Sim; RSFs; Particle Size Analysis Result; Fractal Description; Lateral Stress Ratio; Mohr Circle; Dust Layer; Minimum Ignition Energy; Dust Fires; British Pharmacopoeia; Maximum Explosion Pressure
Publication date: 11-2017
· 17.8x25.4 cm · Hardback
· 17.8x25.4 cm · Hardback
Description
/li>Contents
/li>Biography
/li>
Volume I present an important exposition of some of the most significant areas where particle characterization is applied. The technological fields include pharmaceutical materials, bulk solids, and explosions.
1. Microanalysis 2. Characterization in Various Fields of Application
John Keith Beddow Professor of Chemicals and Materials Engineering, Division of Materials Engineering, University of Iowa.
© 2024 LAVOISIER S.A.S.