Coulomb Interactions in Particle Beams
Advances in Imaging and Electron Physics Series

Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

1. INTRODUCTION
Gerrit Hermanus Jansen
2. HISTORICAL NOTES
Gerrit Hermanus Jansen
3. GENERAL BEAM PROPERTIES
Gerrit Hermanus Jansen
4. THE MANY BODY PROBLEM OF PARTICLES INTERACTING THROUGH AN INVERSE SQUARE FORCE LAW
Gerrit Hermanus Jansen
5. CONCEPTS OF AN ANALYTICAL MODEL FOR STATISTICAL INTERACTIONS IN PARTICLE BEAMS
Gerrit Hermanus Jansen
6. TWO PARTICLE DYNAMICS
Gerrit Hermanus Jansen
7. BOERSCH EFFECT
Gerrit Hermanus Jansen
8. STATISTICAL ANGULAR DEFLECTIONS
Gerrit Hermanus Jansen
9. TRAJECTORY DISPLACEMENT EFFECT
Gerrit Hermanus Jansen
10. FURTHER INVESTIGATIONS ON STATISTICAL INTERACTIONS
Gerrit Hermanus Jansen
11. SPACE CHARGE EFFECT IN LOW DENSITY PARTICLE BEAMS
Gerrit Hermanus Jansen
12. CALCULATION OF DIFFERENT SPOT- AND EDGE-WIDTH MEASURES
Gerrit Hermanus Jansen
13. MONTE CARLO SIMULATION OF PARTICLE BEAMS
Gerrit Hermanus Jansen
14. COMPARISON OF ANALYTICAL RESULTS WITH MONTE CARLO SIMULATIONS
Gerrit Hermanus Jansen
15. COMPARISON OF RECENT THEORIES ON STATISTICAL INTERACTIONS
Gerrit Hermanus Jansen
16. SUMMARY FOR THE ONE-MINUTE DESIGNER
Gerrit Hermanus Janse

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.