Description
Electron Microscopy and Analysis (3rd Ed.)
Author: Goodhew Peter J.
Language: EnglishSubjects for Electron Microscopy and Analysis:
Keywords
CBED Pattern; Higher Order Laue Zones; beam; Spherical Aberration; thin; TEM Specimen; specimen; Condenser Lens; diffraction; Beam Current; pattern; Kikuchi Lines; spherical; Reciprocal Lattice; aberration; Everhart Thornley Detector; inelastic; Ewald Sphere; scattering; Crystal Spectrometer; field; Ewald Sphere Construction; Superconductor Barium Yttrium Copper Oxide; Eel Spectrum; Reciprocal Lattice Point; Backscattered Electrons; EDS System; Extinction Contours; Diffraction Pattern; Stacking Fault; Undeflected Beam; Objective Aperture; Secondary Electrons; Diffracted Beam; Dark Field Image
Publication date: 07-2017
· 15.6x23.4 cm · Hardback
Publication date: 11-2000
252 p. · 15.6x23.4 cm · Paperback
Description
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