Description
Long-Term Non-Operating Reliability of Electronic Products
Author: Pecht Judy
Language: EnglishSubjects for Long-Term Non-Operating Reliability of Electronic Products:
Keywords
Silicon Silicon Oxide Interface; Electrostatic Discharge; Whisker Growth; Multichip Module; Electroless Nickel; Mechanical Failure Mechanisms; Accelerated Life Testing; Non-operating Conditions; Hermetic Packages; Intermetallic Formation; Stress Corrosion Cracking; Parameter Variation Analysis; Crevice Corrosion; Galvanic Corrosion; Antistatic Bags; Varactor Diodes; MOS Device; Gunn Diodes; CDM; SEU; Thermoelectric Coolers; Dominant Failure Mechanisms; Step Stress Test; Reliability Prediction Method; Adhering Corrosion Products
· 15.6x23.4 cm · Hardback
Description
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