Advances in Imaging and Electron Physics
Advances in Imaging and Electron Physics Series, Vol. 116

Coordinator: Hawkes Peter W.

Language: Anglais

262.80 €

Subject to availability at the publisher.

Add to cartAdd to cart
Publication date:
452 p. · 15.2x22.9 cm · Hardback
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Chapter I: Basic Field Equations

Chapter II: Reducible Systems

Chapter III: Basic Mathematical Tools

Chapter IV: The Finite-Difference Method (FDM)

Chapter V: The Finite-Element Method (FEM)

Chapter VI: The Boundary Element Method

Chapter VII: Hybrid Methods

Appendix

Index

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.