Advances in Imaging and Electron Physics

Director of collection: Hawkes Peter W.

Language: English

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270 p. · 15x22.8 cm · Hardback
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
  1. Early History of Wien filters
  2. Katsushige Tsuno and Damaschin Ioanoviciu

  3. Aberration Theory of Wien Filter
  4. Damaschin Ioanoviciu and Katsushige Tsuno Wien Filter Instrumentation

    Katsushige Tsuno and Damaschin Ioanoviciu

  5. Simulation of Multipole Wien Filters
  6. Katsushige Tsuno and Damaschin Ioanoviciu

  7. Wien Filter Applications to Ions
  8. Damaschin Ioanoviciu and Katsushige Tsuno

  9. Application of Wien filters to ElectronsKatsushige Tsuno and Damaschin Ioanoviciu
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field