Description
Fringe 2013, 2014
7th International Workshop on Advanced Optical Imaging and Metrology
Coordinator: Osten Wolfgang
Language: EnglishSubject for Fringe 2013:
Keywords
Adaptive and Active Solution Strategies; Compressed Sensing; Computational Imaging; Digital Wavefront Engineering; Hybrid Optics; In-line Performance; Integration; Inverse-Problems Solution; Miniaturization; Model-Based Reconstruction Technologies; Model-Based Solutions; Multimodality; Real-Time Performance; Remote Technology; Resolution-Enhanced Technologies; Sensor and Data Fusion; Traceability; quality control; reliability; safety and risk
Publication date: 11-2016
Support: Print on demand
Publication date: 08-2013
976 p. · 15.5x23.5 cm · Hardback
Description
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- New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution)
- Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time)
- High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano)
- Hybrid technologies in Optical Imaging and Metrology
(hybrid optics, sensor and data fusion, model-based solutions, multimodality)
- New optical sensors, imaging and measurement systems
(integrated, miniaturized, in-line, real-time, traceable, remote)
Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
A comprehensive overview about the state of the art in modern optical imaging and metrology
Written by the world leading experts in the field
Combination of two disciplines: metrology and imaging