Description
Frontiers in Optical Methods, Softcover reprint of the original 1st ed. 2014
Nano-Characterization and Coherent Control
Springer Series in Optical Sciences Series, Vol. 180
Coordinators: Shudo Ken-ichi, Katayama Ikufumui, Ohno Shin-Ya
Language: EnglishSubject for Frontiers in Optical Methods:
Frontiers in Optical Methods
Publication date: 08-2016
Support: Print on demand
Publication date: 08-2016
Support: Print on demand
Frontiers in Optical Methods
Publication date: 12-2013
228 p. · 15.5x23.5 cm · Hardback
Publication date: 12-2013
228 p. · 15.5x23.5 cm · Hardback
Description
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This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.
Gives a survey of advanced methods in current optical measurements
Reviews the most up-to-date topics in an introductory way
Numerous references to the original works help students and newcomers to enter the field
Includes supplementary material: sn.pub/extras
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