Description
Inside NAND Flash Memories, 2010
Authors: Micheloni Rino, Crippa Luca, Marelli Alessia
Language: English232.09 €
In Print (Delivery period: 15 days).
Add to cart the book of Micheloni Rino, Crippa Luca, Marelli AlessiaPublication date: 10-2014
582 p. · 15.5x23.5 cm · Paperback
232.09 €
In Print (Delivery period: 15 days).
Add to cart the book of Micheloni Rino, Crippa Luca, Marelli AlessiaPublication date: 08-2010
582 p. · 15.5x23.5 cm · Hardback
Description
/li>Contents
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Preface. Acknowledgements.
1 Market and applications for NAND flash memories; Gregory Wong.
2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro.
3 Program and erase of NAND memory arrays; Cristoph Friederich.
4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo.
5 Charge trap NAND technologies ; Alessandro Grossi.
6 Control logic; A. Marelli, R. Micheloni and R. Ravasio.
7 NAND DDR interface; Andrea Silvagni.
8 Sensing circuits; L. Crippa and R. Micheloni.
9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni.
10 MLC storage; L. Crippa and R. Micheloni.
11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa.
12 High voltage overview; R. Micheloni and A. Marelli.
13 Redundancy; A. Marelli and R. Micheloni.
14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni.
15 NAND design for testability and testing; Andrea Silvagni.
16 XLC storage; R. Micheloni and L. Crippa.
17 Flash cards; A. Ghilardelli and S. Corno.
18 Low power 3D-integrated SSD; K. Takeuchi.
19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella.
About the authors. Index.
Flash NAND design
NAND – SSD co-development
Radiation effects on Flash memories
Charge trap technology overview
Includes supplementary material: sn.pub/extras
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