Modern Map Methods in Particle Beam Physics
Advances in Imaging and Electron Physics Series, Vol. 108

Director of collection: Hawkes Peter W.

Language: Anglais

245.61 €

Subject to availability at the publisher.

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350 p. · 15.2x22.9 cm · Hardback
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Dynamics. Differential Algebraic Techniques. Fields. Maps: Calculation. Maps: Properties. Spectrometers. Repetitive Systems.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.