Description
Noncontact Atomic Force Microscopy, 2009
Volume 2
NanoScience and Technology Series
Language: EnglishPublication date: 03-2012
401 p. · 15.5x23.5 cm · Paperback
Publication date: 10-2009
401 p. · 15.5x23.5 cm · Hardback
Description
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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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Noncontact Atomic Force Microscopy 210.99 €