Description
Reliability of Nanoscale Circuits and Systems, 2011
Methodologies and Circuit Architectures
Authors: Stanisavljević Miloš, Schmid Alexandre, Leblebici Yusuf
Language: EnglishSubject for Reliability of Nanoscale Circuits and Systems:
Keywords
Averaging Design Implementations; Fault Models; Fault-Tolerant Approaches; Fault-Tolerant Architectures; Faults; Nanodevices; Nanotechnology; Reliability; Reliability Evaluation Techniques; Statistical Evaluation of Fault-Tolerance Using Probability; System Level Reliability Evaluation and Optimization; quality control; reliability; safety and risk
Approximative price 105.49 €
In Print (Delivery period: 15 days).
Add to cart the book of Stanisavljević Miloš, Schmid Alexandre, Leblebici YusufPublication date: 10-2014
195 p. · 15.5x23.5 cm · Paperback
Approximative price 105.49 €
In Print (Delivery period: 15 days).
Add to cart the book of Stanisavljević Miloš, Schmid Alexandre, Leblebici YusufPublication date: 10-2010
195 p. · 15.5x23.5 cm · Hardback
Description
/li>Contents
/li>Biography
/li>Comment
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Includes supplementary material: sn.pub/extras