Description
Scanning Probe Microscopy, Softcover reprint of the original 1st ed. 2015
Atomic Force Microscopy and Scanning Tunneling Microscopy
NanoScience and Technology Series
Author: Voigtländer Bert
Language: EnglishSubject for Scanning Probe Microscopy:
Publication date: 10-2016
Support: Print on demand
Publication date: 03-2015
382 p. · 15.5x23.5 cm · Hardback
Description
/li>Contents
/li>Biography
/li>Comment
/li>
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.