Description
Test Generation of Crosstalk Delay Faults in VLSI Circuits, Softcover reprint of the original 1st ed. 2019
Language: EnglishSubject for Test Generation of Crosstalk Delay Faults in VLSI Circuits:
Publication date: 12-2018
Support: Print on demand
Publication date: 10-2018
Support: Print on demand
Description
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Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects.- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults.- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm.- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm.- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization.- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model.- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.