Description
Energy Dispersive X-ray Analysis in the Electron Microscope
Authors: Bell DC, Garratt-Reed AJ
Language: EnglishSubjects for Energy Dispersive X-ray Analysis in the Electron Microscope:
Keywords
SEM; characteristic; X-ray Detector; count; Incomplete Charge Collection; rate; Ionization Cross-section; microprobe; Mass Absorption Coefficients; detectors; Crystal Spectrometers; spectrum; NiO Thin Film; crystal; Characteristic X-rays; spectrometer; Electron Energy Loss Spectroscopy; atomic; X-ray Microanalysis; number; HPGe Detector; Eel Spectrum; EDX Spectrum; X-ray Mapping; Top Hat Filtering; Beam Voltage; Pulse Processor; EDX Detector; Successful Stem; ZAF Correction; EDX System; Electron Hole Pair; Fluorescence Yield; SDD; Incident Electron
160 p. · 15.2x22.9 cm · Paperback
Description
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