Description
Introduction to Optical Metrology
Optical Sciences and Applications of Light Series
Author: Sirohi Rajpal S.
Language: EnglishSubjects for Introduction to Optical Metrology:
Keywords
Twyman Green Interferometer; Bessel Beams; Length Measurement; Multiple Beam Interferometry; MEM-Based Measurement; Fizeau Interferometer; Fiber Optic-Based Measurement; Jones Vector; Pressure Measurement; Michelson Interferometer; Velocity Measurement; Fringe Order; Thickness Measurement; Plane Parallel Plate; Angle Measurement; Refractive Index; Optical Testing; Shear Interferometer; Focal Length Measurement; Synthetic Wavelength; Radius of Curvature Measurement; Fringe Width; Refractive Index Measurement; Reference Beam; Optical Techniques; Back Focal Plane; Interferometry; Shear Interferometry; Recording Media; Cube Corner; Detectors; Fiber Optic Fabry Perot Interferometer; Sources; Beam Waist; Laser Beams; Gauge Block; Optics; Fiber Optic Sensors; Optical Metrology; Reference Grating; Common Path Interferometer; Stokes Vector; Phase Shift Algorithms; FLC Cell
· 15.6x23.4 cm · Hardback
Description
/li>Contents
/li>Biography
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Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text:
- Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy
- Describes the different principles used to measure the refractive indices of solids, liquids, and gases
- Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length
- Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements
- Depicts a wave propagating in the positive z-direction by ei(?t ? kz), as opposed to ei(kz ? ?t)
Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Introduction to Optics. Laser Beams. Sources, Detectors, and Recording Media. Interferometry. Techniques. Measurement of Refractive Index. Measurement of Radius of Curvature and Focal Length. Optical Testing. Angle Measurement. Thickness Measurement. Measurement of Velocity. Pressure Measurement. Fiber Optic- and MEM-Based Measurements. Length Measurement.
Rajpal S. Sirohi, Ph.D, is currently chair professor of the Physics Department at Tezpur University, India, and senior editor of Optical Engineering. Previously, he was director of the Indian Institute of Technology Delhi; vice-chancellor of Barkatullah University, Bhopal; vice-chancellor of Shobhit University, Meerut; and vice-chancellor of Amity University, Jaipur. He also served in various capacities at the Indian Institute of Science, Bangalore; Indian Institute of Technology Madras, Chennai; Case Western Reserve University, Cleveland, Ohio, USA; Rose-Hulman Institute of Technology, Terre Haute, Indiana, USA; Institute for Advanced Studies, University of Malaya, Malaysia; University of Namibia; National University of Singapore; and École Polytechnique Fédérale de Lausanne, Switzerland. Widely published and highly decorated, Professor Sirohi is or has been a fellow, honorary fellow, invited fellow, member, board member, and former president of numerous scientific academies, associations, committees, societies, and journals.