Description
Atom Probe Tomography
Put Theory Into Practice
Coordinators: Lefebvre Williams, Vurpillot Francois, Sauvage Xavier
Language: EnglishSubjects for Atom Probe Tomography:
Keywords
3D; Acquisition; Application; Artifacts; Atom probe; Atom; Background; Band bending; Beam; Cluster search; Clustering; Concepts; Contamination; Correlation; Correlative; Damage; Data; Delay line; Detection limit; Detection; Detector; Development; Electric; Emission; Evaporation; FIB; Field; Geometry; HAADF; History; Interaction; Ion; Ionization; laser; Laser; Lift-out; Mass; Mater; Matrix; Measurement; Mechanism; Microscopy; Mining; Model; Modeling; Needle; Photoluminescence; Plasma cleaning; Polishing; Preparation; Probe; Quantum well; Reconstruction; Resolution; SEM; Semiconductor; Simulation; Specimen; Spectrometry; Spectroscopy; Spectrum; STEM; Surface; TEM; Theory; Time of flight; Tip; TKD; Tomography
Support: Print on demand
Description
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Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen?one of the leading scientific research centers exploring the various aspects of the instrument?will further enhance understanding and the learning process.
Introduction
Chapter 1. Atom Probe Fundamentals
Chapter 2. Field Ion Emission Mechanisms
Chapter 3. Field Ion Microscopy
Chapter 4. Specimen Preparation by Focused Ion Beam
Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements
Chapter 6. Atom Probe Tomography Detectors
Chapter 7. 3D Reconstructions
Chapter 8. Laser Assisted Field Evaporation
Chapter 9. Data Mining
Chapter 10. Correlative Microscopy by APT and (S)TEM
Chapter 11. Combining APT and Spectroscopy
Conclusion
Appendix
Index
Master degree and Ph.D. students, Research engineers and senior scientists, University professors
Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science.
Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured ma
- Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
- Written for both experienced researchers and new users
- Includes exercises, along with corrections, for users to practice the techniques discussed
- Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy