Description
Atom-Probe Tomography, 2014
The Local Electrode Atom Probe
Authors: Miller Michael K., Forbes Richard G.
Language: EnglishSubjects for Atom-Probe Tomography:
Approximative price 158.24 €
In Print (Delivery period: 15 days).
Add to cart the print on demand of Miller Michael K., Forbes Richard G.Publication date: 09-2016
Support: Print on demand
Approximative price 158.24 €
In Print (Delivery period: 15 days).
Add to cart the book of Miller Michael K., Forbes Richard G.Publication date: 08-2014
423 p. · 15.5x23.5 cm · Hardback
Description
/li>Contents
/li>Comment
/li>
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe ? a new state-of-the-art instrument ? is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.
Serves as a practical guide for the operation of the technique and analysis of the data
Covers state-of-the-art instrumentation and theories
Includes new and revised data analysis methods and applications
Includes supplementary material: sn.pub/extras