Description
Structural, Syntactic, and Statistical Pattern Recognition, 1st ed. 2016
Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Image Processing, Computer Vision, Pattern Recognition, and Graphics Series
Coordinators: Robles-Kelly Antonio, Loog Marco, Biggio Battista, Escolano Francisco, Wilson Richard
Language: English
Subject for Structural, Syntactic, and Statistical Pattern Recognition:
Keywords
complex networks; machine learning; optimization; semantic segmentation; visualization; artificial intelligence; biometrics; database query processing and optimization; graph mining; graph theory and discrete mathematics; image classification; infromation storage and retrieval; information systems; multi-label classification; nonlinear embedding; object tracking; probabilistic inference problems; programming techniques; semi-supervised learning; structural SV
Support: Print on demand
Description
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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.
Includes supplementary material: sn.pub/extras
