Description
Structural, Syntactic, and Statistical Pattern Recognition, 1st ed. 2021
Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21–22, 2021, Proceedings
Image Processing, Computer Vision, Pattern Recognition, and Graphics Series
Coordinators: Torsello Andrea, Rossi Luca, Pelillo Marcello, Biggio Battista, Robles-Kelly Antonio
Language: English
Subject for Structural, Syntactic, and Statistical Pattern Recognition:
Keywords
artificial intelligence; computer networks; computer science; computer systems; computer vision; directed graphs; education; engineering; graph theory; image analysis; image processing; image segmentation; internet; learning; machine learning; mathematics; neural networks; pattern recognition; signal processing; theoretical computer science; algorithm analysis and problem complexity
Support: Print on demand
Description
/li>Contents
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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.
The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.
