Description
Bias Temperature Instability for Devices and Circuits, Softcover reprint of the original 1st ed. 2014
Coordinator: Grasser Tibor
Language: EnglishSubjects for Bias Temperature Instability for Devices and Circuits:
Publication date: 10-2016
Support: Print on demand
Publication date: 10-2013
810 p. · 15.5x23.5 cm · Hardback
Description
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Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics
Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence
Explains time dependent defect spectroscopy, as a measurement method that operates on nanoscale MOSFETs
Introduces new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior
Includes supplementary material: sn.pub/extras